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Phenom Pure G6 Desktop SEM


Thermo Scientific

Thermo Scientific

The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for the transition from light optical to electron microscopy. It is an economical solution for high-resolution imaging, providing the best imaging results in its class.

The Phenom Pure Desktop SEM provides high-quality images thanks to the long-lasting, high-brightness CeB6 source, and offers the market’s fastest loading and imaging time. The very reliable autofocus and automated source alignments make this the most user-friendly system on the market.

Key Differences

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Never lost navigation

The user always knows the position on the sample with the unique never lost navigation. Overviews of both the optical and electron optical images provide clear reference points at all times. Thanks to the integrated motorized stage, you can navigate quickly through your sample.

Easy to use

Users are ready to take images after only 10 minutes of basic training. A large variety of sample holders is available to accommodate a large range of samples. Sample loading is fast and safe due to our patented sample vacuum loading technology.

Customize your SEM

The Phenom Pure Desktop SEM can be equipped with two optional detector systems.  The first one is a fully integrated energy dispersive spectroscopy (EDS) system. The second is a secondary electron detector (SED) for applications that require surface and topography sensitive imaging.

Process Control

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

Quality Control

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

Technical Specification

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Light optical magnification

  • Fixed 27x

Electron optical magnification range

  • 160–175,000x


  • ≤15 nm

Digital zoom

  • Max. 12x

Light optical navigation camera

  • Color

Acceleration voltages

  • Default: 5 kV and 10 kV

Vacuum modes

  • High-vacuum mode

  • Charge-reduction mode via optional low vacuum sample holder


  • Backscattered electron detector (standard)

  • Energy-dispersive X-ray spectroscopy detector (optional)

  • Secondary electron detector (optional)

Sample size

  • Up to 25 mm diameter

  • 32 mm (optional)

Sample height

  • Up to 35 mm

  • 100 mm (optional)

Phenom Pure G6 Desktop SEM


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