Phenom ParticleX TC Desktop SEM
Description
Thermo Scientific
The Thermo Scientific Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling technical cleanliness at the microscale.
A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification and classification of materials, supporting your production with fast, accurate and trusted data. The system is simple to operate and fast to learn, opening up particle and material analysis to a wider group of users.
Key Differences
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Technical cleanliness
With the growing demand for analysis of smaller particles beyond the scope of light microscopy within (automotive) industries, the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM enables automated scanning electron microscopy with energy-dispersive X-ray spectroscopy (EDS). This is a major advantage over light microscopy as it enables chemical classification of the particles, providing great insights in your production processes and/or environments. Standard reports compliant with VDA 19 / ISO 16232 or ISO 4406/4407 are available.
Secondary electron detector
A secondary electron detector (SED) is optionally available on the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore the perfect choice to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important. This is often the case when studying microstructures, fibers or particles.
General SEM usage
The user interface is based on the proven ease-of-use technology applied in the successful Phenom desktop SEM products. The interface enables both existing and new users to quickly become familiar with the system with a minimum of training.
Elemental mapping and line scan
For a user, it is simply click and go to work with the elemental mapping and line scan functionality of the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The line scan functionality shows the quantified element distribution in a line plot.
Process Control
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality Control
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Cleanliness
More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.
Technical Specification
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Electron optical
Long lifetime thermionic source (CeB6 )
Multiple beam currents
Electron optical magnification range
160 - 200,000x
Light optical magnification
3–16x
Resolution
<10 nm
Image resolution options
960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
Default: 5 kV, 10 kV and 15 kV
Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
Low - medium - high
Detector
Backscattered electron detector (standard)
Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
Secondary electron detector (optional)
Sample size
Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
Max. 40 mm (h)
Sample loading time
Light optical <5 s
Electron optical <60 s
Downloads
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