Phenom XL G2 Desktop SEM

BY
Thermo Scientific
Thermo Scientific

Description

The next-generation Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates your quality control process, providing accurate, reproducible results while freeing up time for value-added work.

Meet quality standards with an intuitive, automated solution that eliminates manual, repetitive tasks:

Obtain the quality information you need to discover failures early and rapidly adjust your production process when needed.
Automate quality control to process a high volume of samples with fewer chances of human error.
Get up to speed quickly with an all-new, easy-to-learn interface ideal for a wide range of applications.
The Phenom XL G2 Desktop SEM features full-screen images and an average time-to image of 60 seconds. The unique CeB6 electron source offers a long lifetime with less maintenance. The small form factor requires little lab space, allowing you to place the microscope exactly where you need it.

Key Differences

Automation

The Phenom XL G2 Desktop SEM is standardly accessible via the Phenom Programming Interface (PPI), a powerful method for controlling the Phenom XL G2 Desktop SEM via Python scripting. If the user has a SEM workflow with repetitive work to analyze particles, pores, fibers or large SEM images, the instrument can do so automatically.

Long-lifetime CeB₆ source

The long-lifetime CeB₆ (cerium hexaboride) source has several advantages. First is the high brightness it provides compared to tungsten, making it much easier for many users to obtain high quality images with many details. Secondly, the lifetime of the source is very long and maintenance can be scheduled.

Eucentric sample holder

In many SEM applications, a user can gain more insight into sample properties if the sample can be tilted and rotated. The optional eucentric sample holder enables eucentric tilt and rotation, making research and analysis faster and more accurate.

Element identification (EID)

The Phenom XL G2 Desktop SEM can be equipped with an optional energy-dispersive X-ray spectroscopy (EDS) detector to obtain more material insights with element identification via X-ray analysis.

Step-by-step data collection

The dedicated software package elemental identification software package (EID) is used to control the fully integrated EDS detector. The intuitive step-by-step process within the EID software helps the user to collect all X-ray results in an organized and structured way.


Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

Cleanliness
 

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.

Technical Specification

Electron optical

  • Long lifetime thermionic source (CeB6 )

  • Multiple beam currents

Electron optical magnification range

  • 160 - 200,000x

Light optical magnification

  • 3–16x

Resolution

  • <10 nm

Image resolution options

  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels

Acceleration voltages

  • Default: 5 kV, 10 kV and 15 kV

  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode

Vacuum levels

  • Low - medium - high

Detector

  • Backscattered electron detector (standard)

  • Secondary electron detector (optional)

  • Energy-dispersive X-ray spectroscopy (EDS) detector (optional)

Sample size

  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)

  • Max. 40 mm (h)

Sample loading time

  • Light optical <5 s

  • Electron optical <60 s

Phenom XL G2 Desktop SEM

Downloads

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