Phenom Perception GSR Desktop SEM
Gunshot residue (GSR) analysis plays an important role in the determination if a firearm has been used in a crime. Established GSR analysis techniques are based on the use of a scanning electron microscope (SEM), which is used to scan the sample and find suspect GSR particles. If a suspect particle is found, an energy dispersive spectroscopy (EDS) technique is used to identify the elements in that particle.
The Thermo Scientific Phenom Perception GSR Desktop SEM is the only dedicated SEM specifically designed for gunshot residue analysis. Because the system is automated, it enables you to speed up the analysis process. With no need to change your settings each time, you can immediately focus on the task at hand.
A high-brightness CeB6 source is at the heart of the desktop Phenom system. This means that you can be confident it will provide reliable, long-lasting daily use and won’t need to be replaced unexpectedly. The Phenom Perception GSR Desktop SEM makes gunshot residue analysis on-demand, faster, easier and more reliable than ever before. Perfect for every busy lab that wants to save time and floor space.
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High throughput, reliable results
Thanks to the fully motorized stage, the Phenom Perception GSR Desktop SEM can handle a scan area of 100 mm x 100 mm. The software uses the internal scan control of the SEM. This enables more accurate beam positioning which especially helps when revisiting the particle in the GSR verification phase. A standard GSR sample holder can hold 30 12mm GSR pin stubs plus the necessary calibration samples.
Fully integrated EDS
The dedicated software package Element Identification (EID) is used to control the fully integrated EDS detector. This EID software is delivered standard as part of the Phenom Perception GSR product.
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
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Max. 100 mm x 100 mm (up to 30 x 12 mm pin stubs)
Max. 40 mm (h)
Compliant with ASTM E1588-17
Typically ≥ 98% hit rate on plano artificial GSR sample
Supports classification of Pb-free ammunition types
Automatic calibrations for reproducible results
Silicon drift detector (SDD)
Thermoelectrically cooled (LN2 free)
Particle relocation, verification and custom report generation
316(w) x 587(d) x 625(h) mm, 75 kg
Standard workstation including: 24” widescreen monitor
169(w) x 445(d) x 432(h) mm, 11kg
Single phase AC 110 - 240 Volt, 50/60 Hz, 300 W (max.)