Phenom ParticleX Steel Desktop SEM
Metallurgists and researchers in steel manufacturing need scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) data for failure analysis and process improvement. The Thermo Scientific Phenom ParticleX Steel Desktop SEM is a multi-purpose desktop SEM enabling failure analysis and automated characterization of non-metallic inclusions in steel.
This versatile solution for high-quality imaging and elemental analysis of steel samples provides the data needed for today's efficient production of high-value steels. Rapid, easy analysis allows you to quickly respond to customer claims of faults, failures, etc., while the automated steel inclusion analysis provides you insight into the steelmaking process.
The Phenom ParticleX Steel Desktop SEM needs only standard wall power, allowing it to extend the capabilities of analytical labs without infrastructure changes. The integrated EDS enables users to simply click-and-go to work with elemental mapping and line scan, which shows the quantified element distribution in a line plot.
Ease of use
The user interface is based on the proven ease-of-use technology applied in the successful Phenom Desktop SEMs. The interface enables both existing and new customers to quickly become familiar with the system with a minimum of training. The high brightness of the unique CeB6 source aids in capturing high image detail as well as rapid automated analysis of steel inclusions.
Building on years of experience in steel inclusion analysis, default classification rules and analysis recipes allow users to quickly capture valuable data.
While the default classification rules and analysis recipe allow you to quickly get started with steel inclusion analysis, the classiifcation and recipes are fully customizable. This allows you to capture new insights in updated recipes
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Electron optical magnification range
160 - 200,000x
Light optical magnification
Image resolution options
960x600, 1920x1200, 3840x2400, 7680x4800 pixels
Default: 5 kV, 10 kV and 15 kV
Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Low - medium - high
Backscattered electron detector (standard)
Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
Secondary electron detector (optional)
Max. 100x100 mm (up to 36 x 12 mm pin stubs)
Max. 40 mm height (optional up to 65 mm)
Sample loading time
Light optical <5 s
Electron optical <60 s